It is well known that semiconductor probe benches are an excellent tool for testing circuits and devices on silicon wafers, bare chips, and open microchips.

serve what purpose?

In Probe Stations, users can test devices using electronic, optical, or RF probes. A wafer can be tested either before or after it has been sawn into individual dies. These tests can be as simple as continuity or isolation checks, or as complex as a full function test of a microcircuit.

Manufacturers can test devices multiple times during production with wafer-level testing, allowing them to identify which process steps result in defects. In applications where packaging costs are high relative to the device cost, it also allows the manufacturer to test the chip prior to packaging.

Finally, can be used for R&D, product design development, and failure problem analysis technology applications where engineers need flexible, accurate tools to systematically test different aspects of devices.

What is the purpose of a probe station?

A probe station is equipped with a device for securing wafers or chips in place and a "stage" for precise positioning. The manipulator, situated on a flat surface known as the pressure plate, allows for the installation of the probe arm and probes. A microscope mounted above the plate aids in accurately placing the probe tips on the device. Once all probes are properly positioned, testing can commence. For wafers containing multiple bare boards, the user may raise the platform to separate the probes from one board and then move it to another, using the microscope to locate its exact position. With identical dies, once the platform is in position and all probe tips are appropriately placed, the platen can be lowered and testing of the next die can begin.

Using a manual system, this is done manually. In semi-automated and fully automated systems, this mold-to-mold movement is automated with a motorized stage and machine vision, reducing the labor costs associated with running multiple tests and increasing the productivity of the probe stage.

• probe station
• wafer-level testing
• by Hailey
• Nov 01,2023
• Topics
• 137

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